发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE TO CONTROL GENERATION OF VOID IN SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to control generation of a void in a semiconductor substrate by improving an interfacial characteristic between a buffer oxide layer and a spacer nitride layer. CONSTITUTION: A buffer oxide layer(18) is formed on a conductive interconnection formed on a semiconductor substrate(10). A heat treatment process using NH3 gas is performed to convert the surface of the buffer oxide layer into a nitride layer. A spacer nitride layer is deposited on the buffer oxide layer to form a nitride layer spacer on the sidewall of the conductive interconnection.
申请公布号 KR20050014215(A) 申请公布日期 2005.02.07
申请号 KR20030052729 申请日期 2003.07.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHAE, SU JIN;JEON, KWANG SEOK;PARK, CHEOL HWAN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址