发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE TO CONTROL GENERATION OF VOID IN SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to control generation of a void in a semiconductor substrate by improving an interfacial characteristic between a buffer oxide layer and a spacer nitride layer. CONSTITUTION: A buffer oxide layer(18) is formed on a conductive interconnection formed on a semiconductor substrate(10). A heat treatment process using NH3 gas is performed to convert the surface of the buffer oxide layer into a nitride layer. A spacer nitride layer is deposited on the buffer oxide layer to form a nitride layer spacer on the sidewall of the conductive interconnection.
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申请公布号 |
KR20050014215(A) |
申请公布日期 |
2005.02.07 |
申请号 |
KR20030052729 |
申请日期 |
2003.07.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHAE, SU JIN;JEON, KWANG SEOK;PARK, CHEOL HWAN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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