发明名称 |
APPARATUS OF FABRICATING SEMICONDUCTOR TO DETERMINE LOCATION OF WAFER ON ESC |
摘要 |
PURPOSE: An apparatus of fabricating a semiconductor is provided to determine the location of a wafer on an ESC(Electro-Static Chuck) by using temperature detected from each part of the wafer. CONSTITUTION: A heater(30) is used for heating a wafer located on an ESC at a constant temperature. A sensor(32) is used for detecting a temperature of the wafer heated by the heater. A controller(34) is used for determining the location of the wafer on the ESC by using the detected temperature of the wafer and outputting a control signal to maintain constantly the temperature of the wafer. A chiller(36) is used for chilling the wafer according to the control signal of the controller.
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申请公布号 |
KR20050014149(A) |
申请公布日期 |
2005.02.07 |
申请号 |
KR20030052637 |
申请日期 |
2003.07.30 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
CHOI, SC |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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