发明名称 APPARATUS OF FABRICATING SEMICONDUCTOR TO DETERMINE LOCATION OF WAFER ON ESC
摘要 PURPOSE: An apparatus of fabricating a semiconductor is provided to determine the location of a wafer on an ESC(Electro-Static Chuck) by using temperature detected from each part of the wafer. CONSTITUTION: A heater(30) is used for heating a wafer located on an ESC at a constant temperature. A sensor(32) is used for detecting a temperature of the wafer heated by the heater. A controller(34) is used for determining the location of the wafer on the ESC by using the detected temperature of the wafer and outputting a control signal to maintain constantly the temperature of the wafer. A chiller(36) is used for chilling the wafer according to the control signal of the controller.
申请公布号 KR20050014149(A) 申请公布日期 2005.02.07
申请号 KR20030052637 申请日期 2003.07.30
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 CHOI, SC
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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