发明名称 |
POLISHING APPARATUS, POLISHING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To reduce an amount of abrasive compound slurry to be consumed in polishing without immersing a wafer in the abrasive compound slurry. <P>SOLUTION: A polishing table 1 is uprightly arranged in a reservoir 7 such that the lower part of the polishing table 1 is immersed in the abrasive compound slurry 8. While a retainer ring 4 and the wafer W are being pushed against a polishing cloth 2 by means of a polishing head 5, the wafer W is polished by turning the polishing table 1 and the polishing head 5. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005028512(A) |
申请公布日期 |
2005.02.03 |
申请号 |
JP20030196687 |
申请日期 |
2003.07.14 |
申请人 |
SEIKO EPSON CORP |
发明人 |
IKEDA KOJI |
分类号 |
B24B53/007;B24B37/00;B24B57/02;H01L21/304 |
主分类号 |
B24B53/007 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|