| 摘要 |
PROBLEM TO BE SOLVED: To provide a test case creation device capable of creating a test case for efficient operation of an LSI function test. SOLUTION: A series of test cases created by connecting a plurality of individual test cases together is carried out by an emulator 5. When an execution result falls into an error in an individual test case, a test case for a simulator 12 is created by adding another test condition to a test condition of the individual test case. In this way, the test case, by which the function test for the LSI can be carried out efficiently, can be created. COPYRIGHT: (C)2005,JPO&NCIPI
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