| 摘要 |
A semi-conductor component test process, and a system for testing semi-conductor components, with which several different semi-conductor-component tests can be conducted in succession. A computer installation, in particular a test apparatus is provided, with which test result data obtained from a first test is evaluated, and which causes a further test provided after the first test), to be performed in an amended fashion, or to be dispensed with, depending on the test result data obtained from the first test.
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