发明名称 SEMICONDUCTOR MANUFACTURING SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing system wherein data about semiconductor design, manufacture, and inspection are dealt with seamlessly. <P>SOLUTION: The semiconductor manufacturing system has memory devices 3000-3003 wherein all data about semiconductor design, semiconductor manufacture, and semiconductor inspection are stored as classes of instances each provided with metadata describing roles of the data in a logically stated form; and a storage area network 2000 wherein the memory devices 3000-3003, semiconductor manufacturing apparatuses 4000 and 4001, and a semiconductor inspecting apparatus 4002 are connected with one another. The memory devices 3000-3003 are seamlessly accessible from the semiconductor manufacturing apparatuses 4000 and 4001, the semiconductor inspecting apparatus 4002, and a semiconductor design environment. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005033013(A) 申请公布日期 2005.02.03
申请号 JP20030196698 申请日期 2003.07.14
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAYA EIKO;TOMIYOSHI CHIKAO
分类号 G03F1/68;G03F7/20;G06F17/50;G06F19/00;G06K9/00;H01L21/00;H01L21/02;H01L21/027;(IPC1-7):H01L21/027;G03F1/08 主分类号 G03F1/68
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