发明名称 Semiconductor device having improved short channel effects, and method of forming thereof
摘要 Semiconductor device having improved short channel effects and method of forming thereof. One method includes forming a gate oxide over a substrate and a gate electrode over the gate oxide, and implanting impurities into the substrate using the gate electrode as an implant mask to form a lightly-doped region in the substrate. The method includes depositing second spacer material adjacent to the gate electrode, forming a first spacer on the second spacer material, and implanting impurities into the substrate and through a portion of the lightly-doped region using the first spacer as an implant mask to form a first junction region in the substrate. The method includes removing the first spacer, etching the second spacer material to form a second spacer adjacent the gate electrode, and implanting impurities into the substrate using the second spacer as an implant mask to form a second junction region in the substrate.
申请公布号 US2005026342(A1) 申请公布日期 2005.02.03
申请号 US20030628747 申请日期 2003.07.28
申请人 FUNG KA-HING;WANG YIN-PING;HUANG HUAN-TSUNG 发明人 FUNG KA-HING;WANG YIN-PING;HUANG HUAN-TSUNG
分类号 H01L21/336;H01L21/8234;H01L21/8238;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L21/336
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