| 摘要 |
<p>Apparatus for use in a conventional dynamic material testing system to advantageously provide uniform self-resistive specimen heating with enhanced temperature uniformity. Specifically, an anvil stack (300) in an anvil assembly (200) has a foil interface (242) with a composite layer (320A, 320B, 320C), containing, e.g., a concentrically oriented multi-component arrangement formed of an inner high strength and insulating disk (315, 325,335) and an outer ring-shaped resistive region (313, 323, 333) , situated between an anvil base (241) and an anvil top (240). An insulating member (243) electrically and thermally insulates all sides of the anvil stack from its supporting structure. This anvil stack can also be used in a conventional dynamic material testing system to advantageously provide enhanced self-resistive specimen heating therein. To do so, a fixture (400) is added to the system. The fixture has two supporting arms (201, 451), each holding one of two opposing and conductive anvil assemblies (200, 453). The fixture applies adequate force to each arm sufficient to hold a specimen (466) in position between the anvil assemblies and establish a good abutting electrical contact between the specimen and each assembly but without exerting enough force to deform the specimen as it is being heated. Separate opposing and existing coaxially-oriented shafts (406, 408) controllably strike both arms and move the anvils together, hence squeezing the specimen and generating each deformation therein. Electrical heating current is controllably applied through the support arms, the anvils and the specimen in order to self-resistively heat the specimen in a predefined temporal manner with respect to the specimen deformations.</p> |
