| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device whereby without converting the setup and hold times specified on a tester-side as a reference by using its output clock into the ones specified as a reference by using its input clock, both the times can be used, as they are, for the inspections of setup and hold times. SOLUTION: In the semiconductor device, the phases of its input and output clocks are compared with each other by a phase comparator 9. Then, the phase of its inner clock inputted to a functional circuit 6 is so varied by a variable delaying element 10 in response to the comparison result of the comparator 9 as to equalize the phases of its input and output clocks to each other. COPYRIGHT: (C)2005,JPO&NCIPI
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