发明名称 IC SOCKET AND INSPECTION METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an IC socket capable of preventing short-circuiting between the leads by installing a recessed part in a plate into which a contact pin is inserted, and to provide an inspection method of a semiconductor device. SOLUTION: The IC socket is equipped with a pin alignment plate 6 fit on a socket body which is a part of a base part, through which the contact pin 1 connecting an electrode on a board and an IC lead 13 of an IC frame acting as a semiconductor element is inserted, and the recessed part 16 acting as a recovery part of conductive foreign matters 17 installed in the pin alignment plate 6 positioned in the surroundings of the contact pin 1. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005032553(A) 申请公布日期 2005.02.03
申请号 JP20030196210 申请日期 2003.07.14
申请人 RENESAS TECHNOLOGY CORP 发明人 IWASAKI HIDEKAZU
分类号 H01R33/76;(IPC1-7):H01R33/76 主分类号 H01R33/76
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