Electrodeposition characteristic measuring device, evaluation method, and control method

摘要

An electrodeposition characteristic measuring device is provided which comprises an impedance analyzer (2) having a quartz crystal (8) and a constant-current power supply unit (1). An electrodeposition characteristic measuring device is provided which comprises the impedance analyzer (2) having the quartz crystal (8) and a constant-Voltage power supply unit (1). An electrodeposition paint characteristic evaluation method is provided which comprises a step of soaking either of the above electrodeposition characteristic measuring devices in an electrodeposition paint and a step of calculating a film thickness (mum) to an applied voltage (V) under electrodeposition painting by an electrodeposition paint in accordance with a resonant frequency and/or resonant resistance shift value obtained from the quartz crystal (8).