NON-DESTRUCTIVE QUALITY CONTROL METHOD FOR MICROARRAY SUBSTRATE COATINGS VIA LABELED DOPING

摘要

A non-destructive method of determining the uniformity of a coating on a substrate comprises coating the substrate with a homogenous coating mixture comprising a labeled compound and a chemically functional compound to which other chemical moieties can be bound, and detecting the presence and locations of the labeled compound on the surface. The invention also relates to a surface for attachment of molecules comprising a substrate and a coating thereon of a homogeneous mixture of a labeled compound and a first chemically functional compound to which other chemical moieties can be bound.