Semiconductor component test system has two test units for separate digital functional and analogue quality test sequences

摘要

A semiconductor component test system has two test units or separate time discrete functional tests (A1)by comparing digital (A1, 2) bit sequences from the component with reference sequences and time continuous quality tests (A2) of analogue (A2, 2) parameters including skew, duty cycle distortion, jitter and intersymbol interference. Independent claims for a procedure using the test system are included.