发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device which can realize good alloy formation between a metal formed on a semiconductor substrate and a semiconductor material without involving the complication of device arrangement and process in order to reduce a risk of thermal cracking in the semiconductor substrate. SOLUTION: A temperature of a heater 24 is kept at a temperature enabling alloy formation between a metal and a semiconductor material, a substrate W is transported into a heating furnace 20, held above the heater 24 for a predetermined time, the substrate W is brought into contact with the heater 24 to form an alloy between the metal and the semiconductor material, the substrate W is moved away from the heater 24, the substrate W is held for a predetermined time above the heater 24, and then the substrate W is transported from the heating furnace 20 to an outside thereof for its cooling. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005033082(A) 申请公布日期 2005.02.03
申请号 JP20030272408 申请日期 2003.07.09
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TANAKA KUNIO;NAKAJIMA SHIGERU
分类号 H01L21/28;H01L21/22;H01L21/24;H01L21/68;H01L21/683;(IPC1-7):H01L21/24 主分类号 H01L21/28
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