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发明名称
Methode zum Testen eines elektronischen Bauteils
摘要
申请公布号
DE60202443(D1)
申请公布日期
2005.02.03
申请号
DE20026002443
申请日期
2002.05.08
申请人
INFINEON TECHNOLOGIES AG
发明人
CHEE HONG, ERIC
分类号
G01R31/30;G11C29/50;G11C29/56;(IPC1-7):G01R31/30;G11C29/00
主分类号
G01R31/30
代理机构
代理人
主权项
地址
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