发明名称 |
Birefringence profiler |
摘要 |
A waveguide under test can be exposed to a light signal whose polarization rotates between the vertical and horizontal polarizations. The intensity detected at a photodetector can be separated into AC and DC components. The AC components may be utilized to derive a characteristics which is indicative of birefringence of the waveguide. If the light signal is scanned over the waveguide under test, a measure of the birefringence at each position along the waveguide may be determined.
|
申请公布号 |
US2005024627(A1) |
申请公布日期 |
2005.02.03 |
申请号 |
US20030631538 |
申请日期 |
2003.07.31 |
申请人 |
JUNNARKAR MAHESH R.;CHAUDHURI BIDHAN P. |
发明人 |
JUNNARKAR MAHESH R.;CHAUDHURI BIDHAN P. |
分类号 |
G01M11/00;G01N21/00;(IPC1-7):G01N21/00 |
主分类号 |
G01M11/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|