发明名称 |
Low DC coil resistance planar writer |
摘要 |
Present processes used for planarizing a cavity filled with a coil and hard baked photoresist require that a significant amount of the thickness of the coils be removed. This increases the DC resistance of the coil. In the present invention, CMP is terminated as soon as the coils are exposed, allowing their full thickness to be retained and resulting in minimum DC resistance. Application of this process to the manufacture of a planar magnetic write head is described.
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申请公布号 |
US2005024770(A1) |
申请公布日期 |
2005.02.03 |
申请号 |
US20030633133 |
申请日期 |
2003.08.01 |
申请人 |
HEADWAY TECHNOLOGIES, INC. |
发明人 |
HAN CHERNG CHYI;CHEN MAO-MIN |
分类号 |
G11B5/147;G11B5/31;(IPC1-7):G11B5/147 |
主分类号 |
G11B5/147 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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