发明名称 MODULE TYPE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a module type semiconductor device wherein a joint and an insulating substrate are not damaged by thermal stress even if a semiconductor element made of silicon carbide is operated at a temperature of at least 300°C. SOLUTION: An insulating ceramic substrate 1 whose coefficient of thermal expansion approaches that of the semiconductor element 3 made of silicon carbide and which uses silicon nitride (Si<SB>3</SB>N<SB>4</SB>) with high heat transfer coefficient is used for the insulating substrate to which the semiconductor element 3 made of silicon carbide is joined. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005032833(A) 申请公布日期 2005.02.03
申请号 JP20030193800 申请日期 2003.07.08
申请人 TOSHIBA CORP 发明人 ISHIWATARI YUTAKA;YAMAMOTO ATSUSHI;MATSUMOTO HISAAKI;SAITO SUZUO;YOSHINO TERUO
分类号 H01L23/34;H01L23/08;H01L23/36;H01L23/373;H01L25/07;H01L25/18;(IPC1-7):H01L23/36 主分类号 H01L23/34
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