发明名称 |
MODULE TYPE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a module type semiconductor device wherein a joint and an insulating substrate are not damaged by thermal stress even if a semiconductor element made of silicon carbide is operated at a temperature of at least 300°C. SOLUTION: An insulating ceramic substrate 1 whose coefficient of thermal expansion approaches that of the semiconductor element 3 made of silicon carbide and which uses silicon nitride (Si<SB>3</SB>N<SB>4</SB>) with high heat transfer coefficient is used for the insulating substrate to which the semiconductor element 3 made of silicon carbide is joined. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005032833(A) |
申请公布日期 |
2005.02.03 |
申请号 |
JP20030193800 |
申请日期 |
2003.07.08 |
申请人 |
TOSHIBA CORP |
发明人 |
ISHIWATARI YUTAKA;YAMAMOTO ATSUSHI;MATSUMOTO HISAAKI;SAITO SUZUO;YOSHINO TERUO |
分类号 |
H01L23/34;H01L23/08;H01L23/36;H01L23/373;H01L25/07;H01L25/18;(IPC1-7):H01L23/36 |
主分类号 |
H01L23/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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