| 摘要 |
A semiconductor circuit can have a standard interface for external data, address and/or command interchange in normal operation and a further test interface provided for a test operation with a semiconductor component and with a BIST unit (built-in self-test) assigned to the semiconductor component. The semiconductor circuit can also have a BIST controller for initialization, testing and application-near setting of the semiconductor component, a read-only nonvolatile memory, a programmable nonvolatile memory, and a volatile memory. The processed data stored as operating, test and/or boot parameters in the programmable nonvolatile memory are used during booting and in normal operation for test and configuration purposes for application-near setting of the semiconductor circuit.
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