发明名称 |
HIGH VOLTAGE TRANSISTOR PROVIDED WITH BENDED CHANNEL FOR INCREASING CHANNEL PUNCH IMMUNITY AND EFFECTIVE CHANNEL LENGTH AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A high voltage transistor and a method for manufacturing the same are provided to increase channel punch immunity by forming a bended channel for increasing effective channel length using LOCOS(LOCal Oxidation of Silicon). CONSTITUTION: A pad oxide layer and a LOCOS nitride layer are sequentially formed on a silicon substrate(100). A field oxide layer is then grown by using LOCOS processing. The field oxide layer is then removed, thereby forming a bended channel. A polysilicon layer is deposited and planarized by CMP, thereby forming a high voltage gate(108). The LOCOS nitride layer is removed. An DDD(Double Diffused Drain) structure(118) is formed by implanting dopants and annealing.
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申请公布号 |
KR20050012951(A) |
申请公布日期 |
2005.02.02 |
申请号 |
KR20030051653 |
申请日期 |
2003.07.25 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KIM, IEE YOUNG;PARK, SUNG KUN |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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