发明名称 HIGH VOLTAGE TRANSISTOR PROVIDED WITH BENDED CHANNEL FOR INCREASING CHANNEL PUNCH IMMUNITY AND EFFECTIVE CHANNEL LENGTH AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A high voltage transistor and a method for manufacturing the same are provided to increase channel punch immunity by forming a bended channel for increasing effective channel length using LOCOS(LOCal Oxidation of Silicon). CONSTITUTION: A pad oxide layer and a LOCOS nitride layer are sequentially formed on a silicon substrate(100). A field oxide layer is then grown by using LOCOS processing. The field oxide layer is then removed, thereby forming a bended channel. A polysilicon layer is deposited and planarized by CMP, thereby forming a high voltage gate(108). The LOCOS nitride layer is removed. An DDD(Double Diffused Drain) structure(118) is formed by implanting dopants and annealing.
申请公布号 KR20050012951(A) 申请公布日期 2005.02.02
申请号 KR20030051653 申请日期 2003.07.25
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, IEE YOUNG;PARK, SUNG KUN
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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