发明名称 |
METHOD FOR FORMING GATE OF SEMICONDUCTOR DEVICE USING SELECTIVE EPITAXIAL GROWTH |
摘要 |
PURPOSE: A method for forming a gate of a semiconductor device is provided to improve stability of a co-salicide by using an SEG(Selective Epitaxial Growth) process. CONSTITUTION: A tunnel oxide layer(43), a gate(45) and a hard mask(47) are sequentially formed on a silicon substrate(41). A dual spacer(49,51) is formed at both sidewalls of the gate and the hard mask. A core oxide layer is formed on the resultant structure. A contact hole is formed to expose the substrate by selectively removing the core oxide layer and the tunnel oxide layer using a photoresist pattern as a mask. The photoresist pattern is removed. An SEG is formed on the hard mask including the contact hole. A control gate(59a) is then formed by selectively etching the SEG.
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申请公布号 |
KR20050012988(A) |
申请公布日期 |
2005.02.02 |
申请号 |
KR20030051803 |
申请日期 |
2003.07.26 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KIM, UI SIK |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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