发明名称 METHOD FOR MANUFACTURING TRANSISTOR WITH UNIFORM SILICIDE LAYER
摘要 PURPOSE: A method for manufacturing a transistor is provided to improve uniformity of a silicide layer and to enhance short channel margin by implanting nitrogen ions before depositing a cobalt film. CONSTITUTION: Nitrogen ions are implanted into a silicon substrate(100) having a junction region(180), a gate(130) and a desired lower structure. Then, a cobalt film is deposited on the resultant structure. A first annealing process is carried out. A cleaning process is performed so as to remove the non-reacted cobalt residues. A second annealing process is then performed.
申请公布号 KR20050012948(A) 申请公布日期 2005.02.02
申请号 KR20030051650 申请日期 2003.07.25
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 SA, SEUNG HOON
分类号 H01L21/24;(IPC1-7):H01L21/24 主分类号 H01L21/24
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