发明名称 |
METHOD FOR MANUFACTURING TRANSISTOR WITH UNIFORM SILICIDE LAYER |
摘要 |
PURPOSE: A method for manufacturing a transistor is provided to improve uniformity of a silicide layer and to enhance short channel margin by implanting nitrogen ions before depositing a cobalt film. CONSTITUTION: Nitrogen ions are implanted into a silicon substrate(100) having a junction region(180), a gate(130) and a desired lower structure. Then, a cobalt film is deposited on the resultant structure. A first annealing process is carried out. A cleaning process is performed so as to remove the non-reacted cobalt residues. A second annealing process is then performed.
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申请公布号 |
KR20050012948(A) |
申请公布日期 |
2005.02.02 |
申请号 |
KR20030051650 |
申请日期 |
2003.07.25 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
SA, SEUNG HOON |
分类号 |
H01L21/24;(IPC1-7):H01L21/24 |
主分类号 |
H01L21/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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