发明名称 Method of fabricating a trench MOSFET
摘要 A trench MOSFET (20) is formed by creating a trench (19) in a semiconductor substrate. A portion of either a side wall of the trench or the bottom of the trench is implanted with an implant species. An insulating layer (21) is then grown overlying the bottom and side wall of the trench (19). The implant species is selected such that the insulating layer (21) grows more quickly on the bottom of the trench than on the side wall of the trench, resulting in a thicker insulating layer in the bottom of the trench than on the trench side walls. <IMAGE>
申请公布号 EP1376674(A3) 申请公布日期 2005.02.02
申请号 EP20030253630 申请日期 2003.06.09
申请人 SILICONIX INCORPORATED 发明人 LICHTENBERGER, KARL;GILES, FREDERICK P.;YUE, CHRISTIANA;TERRILL, KYLE;CHEN, KUO-IN;DARWISH, MOHAMED N.;PATTANAYAK, DEVA;LUI, KAM HONG;XU, ROBERT
分类号 H01L21/265;H01L21/28;H01L21/336;H01L29/08;H01L29/423;H01L29/78 主分类号 H01L21/265
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