发明名称 Wafer processing apparatus and wafer processing method using the same
摘要 An integrated in situ cluster type wafer processing apparatus which can be used for forming metal wiring layers having a multi-layered structure and a wafer processing method using the same are provided. The wafer processing apparatus includes a transfer chamber which can be exhausted and has a plurality of gate valves, a plurality of vacuum processing chambers each of which can be connected to the transfer chamber via one of the gate valves, and a load lock chamber which can be exhausted and is connectable to a first gas feed line for feeding an oxygen-based gas into the load lock chamber. In a wafer processing method, a predetermined layer is formed on a wafer in one of the vacuum processing chambers. The predetermined layer on the wafer is oxidized in the load lock chamber or an oxygen atmosphere chamber.
申请公布号 US6849555(B2) 申请公布日期 2005.02.01
申请号 US20030449522 申请日期 2003.05.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JONG-MYEONG;KIM BYUNG-HEE;LEE MYOUNG BUM;YUN JU-YOUNG;CHOI GIL-HEYUN
分类号 C23C14/56;C23C16/44;H01L21/00;H01L21/02;H01L21/285;H01L21/302;H01L21/461;H01L21/677;H01L21/768;(IPC1-7):H01L21/302 主分类号 C23C14/56
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