发明名称 Maintenance system for analyzing instrument
摘要 In a maintenance system for an analyzing instrument, a maintenance department remotely operates a first computer by a second computer to execute an initial inspection and a basic function inspection of the instrument. Then, an abnormality contained in the result information for every executed inspection is specified, and optimum maintenance information for solving the specified abnormality is searched in a server and extracted. Thereafter, the extracted maintenance information is sent to the first computer in the user side. Namely, an operator at the user side is only required to deal with the maintenance of the instrument in accordance with the maintenance information sent from the maintenance department.
申请公布号 US6850868(B2) 申请公布日期 2005.02.01
申请号 US20010029796 申请日期 2001.12.31
申请人 SHIMADZU CORPORATION 发明人 TANAKA KOKI;YAMAMOTO KOICHI;MIYAGAWA HARUHIKO
分类号 G06Q50/10;G01J3/02;G01J3/28;G06F17/30;G06Q50/00;(IPC1-7):G05B19/04 主分类号 G06Q50/10
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