发明名称 Semiconductor integrated circuit device and manufacturing method of semiconductor integrated circuit device
摘要 A semiconductor device comprises a semiconductor substrate; a first insulating film overlying a surface of the semiconductor substrate, an upper surface of the first insulating film being nitrided; a first copper-embedded interconnection embedded in the first insulating film, and which first copper-embedded interconnection contains copper as a main component; a copper nitride film overlying an upper surface of the first copper-embedded interconnection; a cap insulating film overlying an upper surface of the first insulating film and an upper surface of the copper nitride film; and a second insulting film overlying the cap insulating film.
申请公布号 US6849535(B2) 申请公布日期 2005.02.01
申请号 US20020128265 申请日期 2002.04.24
申请人 RENESAS TECHNOLOGY CORP. 发明人 NOGUCHI JUNJI;OHASHI NAOFUMI;TAKEDA KENICHI;SAITO TATSUYUKI;YAMAGUCHI HIZURU;OWADA NOBUO
分类号 H01L21/3205;H01L21/02;H01L21/28;H01L21/321;H01L21/3213;H01L21/70;H01L21/768;H01L23/532;(IPC1-7):H01L21/44 主分类号 H01L21/3205
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