发明名称 Low leakage single-step latch circuit
摘要 This invention describes circuit techniques providing a means for achieving reliable data retention and low leakage current in single step latches with switch transistors. The techniques require changes only in the circuit configuration. Neither higher cost technology such as multiple-threshold LVT/HVT transistors nor special control circuits are needed.
申请公布号 US6850103(B2) 申请公布日期 2005.02.01
申请号 US20020259128 申请日期 2002.09.27
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 IKENO RIMON;AWAKA KAORU;TANAKA TSUYOSHI;TAKAHASHI HIROSHI;TOYONOH YUTAKA;TAKEGAMA AKIHIRO
分类号 H03K3/012;H03K3/037;(IPC1-7):H03K3/289;H03K3/356 主分类号 H03K3/012
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