发明名称 Method for semiconductor gate line dimension reduction
摘要 To reduce the width of a MOSFET gate, the gate is formed with a hardmask formed thereupon. An isotropic etch is then performed to trim the gate in order to reduce the width of the gate. The resulting gate may be formed with a width that is narrower than a minimum width achievable solely through conventional projection lithography techniques.
申请公布号 US6849530(B2) 申请公布日期 2005.02.01
申请号 US20020334337 申请日期 2002.12.30
申请人 ADVANCED MICRO DEVICES 发明人 BONSER DOUGLAS J.;PLAT MARINA V.;YANG CHIH YUH;BELL SCOTT A.;DAKSHINA-MURTHY SRIKANTESWARA;FISHER PHILIP A.;LYONS CHRISTOPHER F.
分类号 H01L21/28;(IPC1-7):H01L21/476 主分类号 H01L21/28
代理机构 代理人
主权项
地址