发明名称 Automatic activation of ASIC test mode
摘要 An automatic scan test enable signal assertion system and method responds to transitions in signals communicated via selected pins that are not dedicated solely to testing operations. Pins are utilized to communicate a trigger signal and a stage progression signal. The trigger signal provides an indication to initiate a scan test enable signal assertion or deassertion and the stage progression signal controls the progress of the scan test enable activation or deactivation initiation. A scan test enable trigger sensing component provides an assertion or deassertion notification when logical values of a trigger signal captured during multiple stages provide an indication to begin a scan test enable signal assertion or deassertion. A staging component advances the logical values through stages in accordance with a progression signal and issues an asserted or deasserted scan test enable signal based upon the assertion or deassertion notification from the scan test enable trigger sensing component.
申请公布号 US6851080(B1) 申请公布日期 2005.02.01
申请号 US19990368918 申请日期 1999.08.05
申请人 3COM CORPORATION 发明人 TRABER RICHARD L.;YANG LI-JAU
分类号 G01R31/317;G01R31/3185;(IPC1-7):G01R31/28;H03K19/00 主分类号 G01R31/317
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