发明名称 Thin gate dielectric for a CMOS transistor and method of fabrication thereof
摘要 A method of making a thin gate dielectric includes implanting a barrier substance into a region of a silicon substrate. A capacitance-increasing material is implanted into the silicon substrate. An outside layer of the silicon substrate is oxidized to form a first silicon oxide layer. The silicon substrate is oxidized between the first silicon oxide layer and the region.
申请公布号 US6849512(B1) 申请公布日期 2005.02.01
申请号 US20020283630 申请日期 2002.10.30
申请人 LSI LOGIC CORPORATION 发明人 LO WAI;KIMBALL JAMES P.;HORNBACK VERNE C.
分类号 H01L21/265;H01L21/28;H01L29/51;(IPC1-7):H01L21/336 主分类号 H01L21/265
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