发明名称 |
MAGNETIC MEMORY DEVICE AND MANUFACTURING METHOD THEREOF TO PREVENT RESIDUAL FILM FROM SHORT-CIRCUITING INSULATING BARRIER LAYER BY USING MAGNETO-RESISTIVE ELEMENT |
摘要 |
PURPOSE: A magnetic memory device and a manufacturing method thereof are provided to prevent a residual film of processed material remaining on the side surface of the processed part of the MTJ element in the micro-manufacturing process from short-circuiting the insulating barrier film. CONSTITUTION: A wiring layer is formed on a substrate. The wiring layer includes a lower electrode(28), a magneto-resistive element formed on the lower electrode and configured to include an insulation barrier layer, at least one contact layer stacked on the magneto-resistive element, and an upper wiring connected to the contact layer. A taper angle of a lateral surface of the magneto-resistive element including the insulation barrier layer, relative to a bottom surface of the magneto-resistive element, is about 60 degrees or less. The contact layer and the magneto-resistive element are formed in a self-alignment manner.
|
申请公布号 |
KR20050011727(A) |
申请公布日期 |
2005.01.29 |
申请号 |
KR20040057121 |
申请日期 |
2004.07.22 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
AMANO, MINORU;NAKAJIMA, KENTARO;TAKAHASHI, SHIGEKI;UEDA, TOMOMASA |
分类号 |
H01L27/105;C23F4/00;G11C11/00;G11C11/02;H01F10/32;H01F41/30;H01L21/336;H01L21/8246;H01L27/00;H01L27/22;H01L29/76;H01L31/119;H01L43/08;H01L43/12;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|