发明名称 MAGNETIC MEMORY DEVICE AND MANUFACTURING METHOD THEREOF TO PREVENT RESIDUAL FILM FROM SHORT-CIRCUITING INSULATING BARRIER LAYER BY USING MAGNETO-RESISTIVE ELEMENT
摘要 PURPOSE: A magnetic memory device and a manufacturing method thereof are provided to prevent a residual film of processed material remaining on the side surface of the processed part of the MTJ element in the micro-manufacturing process from short-circuiting the insulating barrier film. CONSTITUTION: A wiring layer is formed on a substrate. The wiring layer includes a lower electrode(28), a magneto-resistive element formed on the lower electrode and configured to include an insulation barrier layer, at least one contact layer stacked on the magneto-resistive element, and an upper wiring connected to the contact layer. A taper angle of a lateral surface of the magneto-resistive element including the insulation barrier layer, relative to a bottom surface of the magneto-resistive element, is about 60 degrees or less. The contact layer and the magneto-resistive element are formed in a self-alignment manner.
申请公布号 KR20050011727(A) 申请公布日期 2005.01.29
申请号 KR20040057121 申请日期 2004.07.22
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 AMANO, MINORU;NAKAJIMA, KENTARO;TAKAHASHI, SHIGEKI;UEDA, TOMOMASA
分类号 H01L27/105;C23F4/00;G11C11/00;G11C11/02;H01F10/32;H01F41/30;H01L21/336;H01L21/8246;H01L27/00;H01L27/22;H01L29/76;H01L31/119;H01L43/08;H01L43/12;(IPC1-7):H01L27/105 主分类号 H01L27/105
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