发明名称 Semiconductor device for integrated circuit, has gate electrodes and gate oxide layers of LDMOS and MOS transistors formed independently in substrate, and drain and source regions of transistors formed in self aligned manner in substrate
摘要 <p>The device has a metal oxide semiconductor (MOS) transistor and a lateral double diffusion MOS (LDMOS) transistor formed on a substrate (1). Gate electrodes (15,31) and gate oxide layers (13,29) of the LDMOS and MOS transistors, respectively are formed independent of each other in the substrate. Drain and source regions of LDMOS and MOS transistors are respectively formed in a self aligned manner in the substrate. Independent claims are also included for the following: (a) an integrated circuit (b) a method of fabrication of a semiconductor device.</p>
申请公布号 FR2858112(A1) 申请公布日期 2005.01.28
申请号 FR20040008171 申请日期 2004.07.23
申请人 RICOH CY LTD 发明人 SHIMIZU AKIRA;NEGORO TAKAAKI
分类号 H01L29/78;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/94;(IPC1-7):H01L21/823 主分类号 H01L29/78
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