发明名称 ATOMIC LAYERED DEPOSITION APPARATUS AND DEPOSITING METHOD THEREOF FOR REDUCING PROCESS TIME AND INCREASING THROUGH-OUTPUT IN MULTI-LAYER DEPOSITION PROCESS
摘要 PURPOSE: An atomic layered deposition apparatus and a depositing method thereof are provided to lower a deposition temperature, deposit a multi-layer, and improve a processing speed by installing a plasma generation unit at a gas injection part. CONSTITUTION: A wafer(10) is loaded on a disk(20). A shower head(40) is positioned at a predetermined position apart from the disk. A gas injection part is connected to the shower head. A plasma generation unit is installed around the gas injection part. The plasma generation unit includes a coil formed around an outer circumference of a gas injection hole and a magnet plate formed around the coil. A circular plate having fine holes is installed in the gas injection part in order to constrain the plasma within the gas injection part.
申请公布号 KR20050010689(A) 申请公布日期 2005.01.28
申请号 KR20030050074 申请日期 2003.07.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWON, HYUG JIN
分类号 H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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