发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE FOR IMPROVING THROUGHPUT OF EQUIPMENT
摘要 PURPOSE: A method of manufacturing a semiconductor device is provided to improve throughput of a bit of equipment by reducing the time required to load a new wafer into a process chamber from the unloaded point of a process-performed wafer using two modes according to situations. CONSTITUTION: A process chamber is provided(S10). A first transfer chamber and a first loadlock chamber are provided(S20). A second transfer chamber and a second loadlock chamber are provided(S30). First and second cassettes are provided to the first and second loadlock chambers, respectively(S40). Whether the second cassette includes wafers is checked(S50). When the wafers exist in the second cassette, a first mode is used for the following process. When even one wafer is free from the second cassette, a second mode is used for the following process(S60).
申请公布号 KR20050010566(A) 申请公布日期 2005.01.28
申请号 KR20030049776 申请日期 2003.07.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHAE, SEUNG WON;HER, BYUNG DO;LIM, TAE SUP;OH, SANG GUN;PARK, HYEON JIN;YANG, YUN MO
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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