发明名称 |
GRINDER AND GRINDING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a grinder and a grinding method which automatically stabilizes or varies a relative positional relation between a ground object and a grinding tool in real time, and immediately detects abnormal grinding in real time, without trusting engineer's intuition or experience. SOLUTION: The grinder 1 comprises a turn table 10 for holding and rotating a semiconductor wafer (ground object) W and a grinding tool 40 to which a grinding wheel 45 is attached and that rotates and drives. The grinder 1 grinds the ground surface of the semiconductor wafer W into a flat surface by relatively moving the semiconductor wafer W and the grinding tool 40 while the grinding wheel 45 of the grinding tool 40 is pressed onto the semiconductor wafer W held by the turn table 10. Aside from a bearing (air spindle) 49 for pivoting a driving shaft 47 for rotating the grinding tool 40, a magnetic bearing 60 for controlling the attitude of the grinding tool 40 is installed near the grinding tool 40. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005022059(A) |
申请公布日期 |
2005.01.27 |
申请号 |
JP20030270460 |
申请日期 |
2003.07.02 |
申请人 |
EBARA CORP;EBARA DENSAN LTD |
发明人 |
ISHII YU;SATO KAZUKI;NAKAZAWA TOSHIHARU |
分类号 |
B24B41/047;B23B19/02;B24B7/04;B24B49/10;F16C32/04;F16C32/06;H01L21/304;(IPC1-7):B24B41/047 |
主分类号 |
B24B41/047 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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