发明名称 SURFACE INSPECTION METHOD AND SURFACE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce or eliminate the nonuniformity of detected light intensity depending on the nonuniformity of light intensity distribution on an inspected surface with a light beam incident thereupon, when detecting scattered light by decomposing it into a plurality of channels, as to this surface inspection device. SOLUTION: A light intensity detection means 50 detects the intensity of scattered light from each area of an irradiation field 220 by spatially decomposing it so that the intensity of decomposed/scattered light detected by channel ch does not depend on nonuniformity of received light intensity distribution among respective areas in the irradiation field 220. The gain of each amplifier 52 corresponding to each decomposition channel ch of the detection means 50 is adjusted to standardize the intensity of decomposed/scattered light. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005024327(A) 申请公布日期 2005.01.27
申请号 JP20030188102 申请日期 2003.06.30
申请人 TOPCON CORP 发明人 MIYAGAWA KAZUHIRO;IWA YOICHIRO;SEKINE AKIHIKO
分类号 G01N21/47;G01N21/94;G01N21/95;G01N21/956;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01N21/47
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