发明名称 STAGE APPARATUS AND CHARGED PARTICLE BEAM EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a stage apparatus, etc. which can reduce a disturbance magnetic field arising due to generation of eddy current in association with the drive of a linear motor. SOLUTION: The stage apparatus 10 includes a plurality of aligned tile-like permanent magnets 30 provided along a moving direction on the upper and the lower plates of a guide member 13A (14A). Meanwhile, the stage apparatus 10 also includes an electromagnetic coil and a heat pipe 41 mounted at a Y slider. A length L (length along the moving direction) of the heat pipe 41 is set to seven times as large as the pole pitch P of the permanent magnet 30. Thus, eddy current generated in the heat pipe 41 in association with the drive of a stage can be reduced, and the change of a disturbance magnetic field can be reduced. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005026334(A) 申请公布日期 2005.01.27
申请号 JP20030187934 申请日期 2003.06.30
申请人 NIKON CORP 发明人 TAKEKOSHI HIDEKAZU
分类号 G03F7/20;G03F9/00;H01L21/027;H02K41/03;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址