发明名称 X-RAY FLUOROSCOPE FOR PRECISE MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide an X-ray fluoroscope which measures actual dimensions with high precision on a screen, even for an area of interest, within an object of fluoroscopy, to which the distance from the surface of a sample table is unknown, after performing spatial calibration using a reference sample. SOLUTION: When performing spatial calibration, the X-ray fluoroscope stores fluoroscopic magnifying power M together with a spatial calibration value C. When observing an arbitrary area of interest V within the object of fluoroscopy W, the X-ray fluoroscope precisely calculates the fluoroscopic magnifying power m of the area of interest V by calculating the height h above the surface of the sample table 2, updates the spatial calibration value based on the ratio between M and m, and measures actual dimensions between arbitrary two points on the screen by using the spatial calibration value, regardless of a change in fluoroscopic magnifying power. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005024506(A) 申请公布日期 2005.01.27
申请号 JP20030270746 申请日期 2003.07.03
申请人 SHIMADZU CORP 发明人 MITSUHARA MASAYUKI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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