| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device having a simple structure and tested at an actual working speed by using a general-purpose LSI tester. SOLUTION: A functional block FA outputs output data Y1 and Y2 corresponding to an inputted function pattern in synchronization with a clock signal equal to the actual working speed. The output data Y1 and Y2 are selected in selector circuits SEL1 and SEL2 and inputted into already scan-inserted circuits SCB and SCC of functional blocks FB and FC. When the scan-inserted circuits SCB and SCC are set to be in a scan mode, a scan flip-flop circuit SFF is stored with the output data Y1 and Y2 in synchronization with the clock signal. When the functional pattern of the functional block FA comes to an end, the output data stored in the flip-flop circuit SFF are outputted in synchronization with a scan clock signal of low speed to compare the data with corresponding expectation values. COPYRIGHT: (C)2005,JPO&NCIPI
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