发明名称 LOAD LOCK OPTIMIZATION METHOD AND SYSTEM
摘要 A method and system of optimizing a state change can include isolating a load at a first state, such as a wafer cassette, a wafer photoresist, a prosthetic device, or other device to be implanted, in a load lock of a wafer implanter, and bringing the load from the first state to a lock set point state, such as by pumping down the load lock to vacuum. The load may then be exposed to an environment at a second state, such as in an implant chamber with conditions desirable for implanting, that may be disturbed by the exposing, and the second state may then re-established. The time to re-establish the second state may be optimized as a function of the time to reach the lock set point state. For the implanter, the time to first implant may be optimized as a function of pump down time.
申请公布号 WO2004025701(A3) 申请公布日期 2005.01.27
申请号 WO2003US28213 申请日期 2003.09.10
申请人 VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.;EVANS, MORGAN, D. 发明人 EVANS, MORGAN, D.
分类号 B65G49/00;G05B19/418;H01L21/265;H01L21/677 主分类号 B65G49/00
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