发明名称 MEASURING METHOD FOR DIMENSION OF SLIT CLEARANCE, ADJUSTING METHOD, AND MEASURING DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To measure the dimension of a slit clearance precisely without harming the inside of the slit. SOLUTION: The dimension of the slit clearance is determined as follows: the slit 6 formed between two members 2, 3 is assembled by inserting a film 11, the thickness of which is known, between the two members 2, 3; a film fixture 12 grasps the film 11 and is pulled up by a hoist shaft 16; the film 11 is removed from the slit 15 while measuring the pull up force by a force gauge 14 provided on the middle of the wire 13; and thereby the dimension of the slit clearance can be determined by the thickness of the film and the draw out force. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005024406(A) 申请公布日期 2005.01.27
申请号 JP20030190564 申请日期 2003.07.02
申请人 DAINIPPON PRINTING CO LTD 发明人 NAKANO KOICHI
分类号 G01B21/16;B05C5/02;B05C11/00;B05D1/26;B05D3/00;(IPC1-7):G01B21/16 主分类号 G01B21/16
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