发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of being fabricated through an easy process while exhibiting good high frequency characteristics and high electrostatic breakdown voltage, and to provide its fabricating process. SOLUTION: An npn-type bipolar transistor Bip1 consisting of an epitaxial layer 2, a base diffusion layer 5, a base connection layer 4 and an emitter diffusion layer 6, and a pn-junction diode D1 consisting of the epitaxial layer 2 and an anode layer 3 are formed on a semiconductor substrate 1. The base connection layer 4 and the anode layer 3 are formed by an identical process. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005026392(A) 申请公布日期 2005.01.27
申请号 JP20030189289 申请日期 2003.07.01
申请人 RENESAS TECHNOLOGY CORP 发明人 NOGUCHI YUJI;ISHII KOJU;TSUKAGOSHI NOBUO;YASUDA TAKESHI
分类号 H01L21/331;H01L21/822;H01L21/8222;H01L27/04;H01L27/06;H01L29/732;(IPC1-7):H01L21/822 主分类号 H01L21/331
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