发明名称 METHOD OF DETERMINING DEPTH OF DEFECTS
摘要 PROBLEM TO BE SOLVED: To provide a method which facilitates inspection of a component surface (28). SOLUTION: The method comprises positioning a surface of the component to be inspected (10) in an optical path (24) of at least one infrared radiation detector (26), heating the component surface using electromagnetic radiation to cause an increase in radiance from a defect (70) present at the component surface, and detecting temperature variations within the component surface using the at least one infrared radiation detector, so that the surface irradiance is measured at predetermined locations across the component surface. The method further comprises detecting cracks in the component by analyzing radiation transient response data received by the infrared radiation detector, and correlating the temperature variations to the radiation transient response data to determine a depth of the detected cracks. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005024556(A) 申请公布日期 2005.01.27
申请号 JP20040190615 申请日期 2004.06.29
申请人 GENERAL ELECTRIC CO 发明人 DEVITT JOHN WILLIAM;BAUCO ANTHONY S;CANTELLO CRAIG ALAN;HARDING KEVIN G
分类号 G01N25/72;(IPC1-7):G01N25/72 主分类号 G01N25/72
代理机构 代理人
主权项
地址