发明名称 MAIN-CIRCUIT DIAGNOSTIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To speedily and accurately verify phase test by bringing a main circuit into a final state of connection and automating phase test processes. SOLUTION: This main-circuit diagnostic apparatus outputs a phase-test check sinal to a current transformer 22 on one end among current transformers 22 and 23 installed on both ends of the main circuit 20 to be diagnosed, receives the input of an answerback phase-test check signal from the current transformer 23 on the other end, and compares the inputted and outputted phase-test check signals with each other by a comparing means 6 to diagnose the state of connection of the main circuit. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005024263(A) 申请公布日期 2005.01.27
申请号 JP20030186794 申请日期 2003.06.30
申请人 TOSHIBA CORP 发明人 IIDA SHOJI
分类号 G01R31/02;(IPC1-7):G01R31/02 主分类号 G01R31/02
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