发明名称 Silicon wafer based macroscopic mirror for wide angle scanning applications
摘要 A macroscopic mirror for wide angle scanning applications comprises: a silicon substrate section of a predetermined shape and macroscopic size cut from a silicon wafer comprising a flat, polished surface side and an etched, rough surface side; and a plurality of layers, including a layer of reflective medium, disposed on the flat, polished surface of the substrate section in such a manner to minimize flexural distortion of the flat surface. The macroscopic mirror is made by a method comprising the steps of: preparing the silicon wafer by polishing one side to a predetermined flatness and etching the other side to a predetermined roughness; cutting the substrate section from the prepared silicon wafer to a predetermined shape and macroscopic size; and applying the plurality of layers on the flat, polished surface. The macroscopic mirror is included in a mirror system wherein the rough surface side is bonded to supporting arms of a drive mechanism which scans the mirror at a predetermined scanning rate in at least one plane of rotation.
申请公布号 US2005018329(A1) 申请公布日期 2005.01.27
申请号 US20040921522 申请日期 2004.08.19
申请人 PESIK JOSEPH T. 发明人 PESIK JOSEPH T.
分类号 G02B5/08;G02B7/182;G02B26/08;G02B26/10;(IPC1-7):G02B26/08 主分类号 G02B5/08
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