发明名称 Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems
摘要 In one aspect, the invention features a method, including using an interferometer in an interferometry system to produce an output beam comprising a phase related to an optical path difference between a path of a first beam and a path of a second beam, wherein the first beam contacts a measurement object at a first location and the first or second beam contacts the measurement object at a second location, and wherein the first and second locations are different, providing precalibrated information that accounts for contributions to the optical path difference caused by a deviation of the path of the first or second beam from a nominal beam path due to an imperfection of the measurement object at the first location and due to an imperfection of the measurement object at the second location, and determining a position of the measurement object with respect to at least one degree of freedom based on information derived from the output beam and the precalibrated information.
申请公布号 US2005018206(A1) 申请公布日期 2005.01.27
申请号 US20040872304 申请日期 2004.06.18
申请人 HILL HENRY A. 发明人 HILL HENRY A.
分类号 G01B9/02;G03F7/20;(IPC1-7):G01B9/02 主分类号 G01B9/02
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