| 发明名称 |
ELECTRON LENS FOR ELECTRON MICROSCOPE AND THE LIKE |
| 摘要 |
Movable magnetic compensating pieces are disposed on a lower magnetic path unit of an electron lens. The compensating pieces are in partial contact with the lower magnetic path unit and moved toward and away from each other on the lower magnetic path unit by manipulation form the exterior of the lens.
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| 申请公布号 |
US3643191(A) |
申请公布日期 |
1972.02.15 |
| 申请号 |
USD3643191 |
申请日期 |
1970.06.10 |
| 申请人 |
HITACHI LTD. |
发明人 |
SHOZO KASAI;DAISABURO SHIMIZU;SHINJIRO KATAGIRI |
| 分类号 |
H01J37/14;H01J37/141;(IPC1-7):H01F1/00 |
主分类号 |
H01J37/14 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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