发明名称 METHOD FOR FABRICATING DRAM CELL WITH PLANAR CAPACITOR STRUCTURE OF LOW COUPLING NOISE TO INCREASE SENSING MARGIN OF SENSE AMPLIFIER
摘要 PURPOSE: A method for fabricating a DRAM(dynamic random access memory) cell with a planar capacitor structure of low coupling noise is provided to increase a sensing margin of a sense amplifier by intercepting bitline coupling noise without an additional process. CONSTITUTION: A structure of a gate(112) and a planar capacitor(114) is formed on a silicon substrate(100). An interlayer dielectric(118) is formed on the silicon substrate including the structure of the gate and the planar capacitor. A metal contact is formed between the gates. A bitline is formed on the metal contact. An insulation layer(126) between interconnections is formed on the silicon substrate having the bitline. After a via hole is formed between the bitlines on the insulation layer between the interconnections, the via hole is filled with a metal layer to form a via contact(130). A metal interconnection(132) is formed on the via contact. The metal interconnection is connected to the ground.
申请公布号 KR20050009516(A) 申请公布日期 2005.01.25
申请号 KR20030048849 申请日期 2003.07.16
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 CHUNG, EUN YOUNG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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