发明名称 |
METHOD FOR FABRICATING DRAM CELL WITH PLANAR CAPACITOR STRUCTURE OF LOW COUPLING NOISE TO INCREASE SENSING MARGIN OF SENSE AMPLIFIER |
摘要 |
PURPOSE: A method for fabricating a DRAM(dynamic random access memory) cell with a planar capacitor structure of low coupling noise is provided to increase a sensing margin of a sense amplifier by intercepting bitline coupling noise without an additional process. CONSTITUTION: A structure of a gate(112) and a planar capacitor(114) is formed on a silicon substrate(100). An interlayer dielectric(118) is formed on the silicon substrate including the structure of the gate and the planar capacitor. A metal contact is formed between the gates. A bitline is formed on the metal contact. An insulation layer(126) between interconnections is formed on the silicon substrate having the bitline. After a via hole is formed between the bitlines on the insulation layer between the interconnections, the via hole is filled with a metal layer to form a via contact(130). A metal interconnection(132) is formed on the via contact. The metal interconnection is connected to the ground.
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申请公布号 |
KR20050009516(A) |
申请公布日期 |
2005.01.25 |
申请号 |
KR20030048849 |
申请日期 |
2003.07.16 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
CHUNG, EUN YOUNG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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