发明名称 |
METHOD OF FORMING UNIFORMLY THIN COBALT SILICIDE LAYER WITHOUT SPIKING USING BUFFER LAYER |
摘要 |
PURPOSE: A method is provided to form uniformly a thin cobalt silicide layer without spiking by forming a titanium nitride buffer layer between a cobalt film and a silicon layer. CONSTITUTION: A titanium nitride buffer layer(20) is formed on a silicon layer(10) by using a PVD(Physical Vapor Deposition) and a cobalt film(30) is formed thereon. A capping layer(40) for protecting the cobalt film from oxygen is sequentially deposited thereon. A thin cobalt silicide layer(S2) is uniformly formed on the silicon layer by using two-step heat treatments.
|
申请公布号 |
KR20050009427(A) |
申请公布日期 |
2005.01.25 |
申请号 |
KR20030048737 |
申请日期 |
2003.07.16 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
KIM, HYOUNG YOON |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|