发明名称 METHOD OF FORMING UNIFORMLY THIN COBALT SILICIDE LAYER WITHOUT SPIKING USING BUFFER LAYER
摘要 PURPOSE: A method is provided to form uniformly a thin cobalt silicide layer without spiking by forming a titanium nitride buffer layer between a cobalt film and a silicon layer. CONSTITUTION: A titanium nitride buffer layer(20) is formed on a silicon layer(10) by using a PVD(Physical Vapor Deposition) and a cobalt film(30) is formed thereon. A capping layer(40) for protecting the cobalt film from oxygen is sequentially deposited thereon. A thin cobalt silicide layer(S2) is uniformly formed on the silicon layer by using two-step heat treatments.
申请公布号 KR20050009427(A) 申请公布日期 2005.01.25
申请号 KR20030048737 申请日期 2003.07.16
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 KIM, HYOUNG YOON
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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