发明名称 Semiconductor memory device capable of relieving defective cell
摘要 A semiconductor memory device includes a data line shift circuit, a plurality of data mask lines connected to the plurality of sense amplifier write circuits, respectively, and a plurality of mask circuits. The plurality of mask circuits each include at least one shift switch circuit and supply a mask signal to a sense amplifier write circuit, which is connected to a mask circuit different from that before a data line is shifted by the data line shift circuit, through the shift switch circuit and supply the mask signal to a sense amplifier write circuit, which is connected to the same mask circuit as that before the data line is shifted, not through the shift switch circuit.
申请公布号 US6847564(B2) 申请公布日期 2005.01.25
申请号 US20030456478 申请日期 2003.06.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUKUDA RYO
分类号 G11C29/04;G11C11/401;G11C11/407;G11C11/4096;G11C29/00;(IPC1-7):G11C7/00;G06F12/00 主分类号 G11C29/04
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